Active standards under the jurisdiction of E42

E673-03 Standard Terminology Relating to Surface Analysis
E684-04 Standard Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces
E827-08 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
E902-05 Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
E983-05 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
E984-06 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
E995-04 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
E1016-07 Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
E1078-09 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
E1127-08 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
E1162-06 Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
E1438-06 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
E1504-06 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
E1523-09 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
E1577-04 Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
E1634-02(2007) Standard Guide for Performing Sputter Crater Depth Measurements
E1635-06 Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
E1636-04 Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function
E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
E1829-09 Standard Guide for Handling Specimens Prior to Surface Analysis
E1880-06 Standard Practice for Tissue Cryosection Analysis with SIMS
E1881-06 Standard Guide for Cell Culture Analysis with SIMS
E2108-05 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
E2426-05 Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS
E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps
E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy

Proposed new standards under the jurisdiction of E42

WK13221 Standard Guide to:Analysis Protocol for Thin Corrosion Layers using
Surface Analysis Techniques (Technical Contact: Donald Baer)

WK19049 Consistence and Reproducibility of Sputter Rate Measurements
(Technical Contact: Mark Engelhard)

WK21206 Dimensions of Knife-Edge Flanges (Technical Contact: Stuart Tison)

WK23393 Standard Guide for Selection of Calibrations Needed for X-ray
Photoelectron Spectroscopy (XPS) Experiments (Technical Contact: Susan
Kerber)