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Page 1 of 2 ASTM and Standards for Surface Analysis
ASTM International is an open forum for the development of high quality, market relevant international standards used around the globe.
ASTM Committee E42 on Surface Analysis was formed in 1976. E42 meets once a year, usually in October on the Sunday prior to the annual AVS/ASSD meeting on Surface Analysis or the International AVS Symposium.
Standards under the jurisdiction of E42
Each main committee in ASTM International is composed of subcommittees that address specific segments within the general subject area covered by the technical committee.
E42.02 Terminology
E42.03 Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
E42.06 SIMS
E42.08 Ion Beam Sputtering
E42.13 Vacuum Technology
E42.14 STM/AFM
E42.15 Electron Probe Microanalysis/Electron Microscopy
E42.90 Executive
E42.91 Awards
E42.92 US TAG ISO/TC 201
E42.94 US TAG ISO/TC 112
E42.96 US TAG ISO/TC 202
There's more on the ASTM web site, here:
ASTM International
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Surface Analysis 