Home Application Topics Spectromicroscopy Recent Publications - Spectromicroscopy
Recent Publications - Spectromicroscopy PDF Print E-mail
Written by Adam Roberts   
Thursday, 10 May 2007 08:31
A recently published article by Hong Piao gives an excellent overview of the capabilities of the AXIS spectrometers and the application of multivariate analysis of image datasets. The paper 'Understanding delamination in microelectronic devices using AES, XPS and chemometrics' is published by Wiley in Surface and Interface Analysis 2007 39 493-500.
Last Updated on Thursday, 10 May 2007 08:32