Two significant changes in the make up of ISO TC-201 sub-committees - the official international standards bodies for surface chemical analysis - came into full function at the recent ISO TC-201 plenary held in San Francisco.

Dr Chris Moffitt ( Senior Applications Specialist with Kratos, NY) took over as ANSI sponsored Chair of ISO/TC201 SC2 (Sub-Committtee Two on General Procedures) and Kazuhiro Takahashi (Kratos Japan, Hadano), JISC sponsored expert in SC5/SC7 (AES and XPS) was seconded to an SC7 study group (with Dr. H. Iwai) to investigate preparation of a guide to curve fitting in X-ray photoelectron spectroscopy.

Chris chairs the TC-201 SC2 meeting in San Francisco.
Also in the picture Dr Cedric Powell (VAMAS & NIST), Joe Geller (leader, US national delegation) and behind, Drs Carrick and Roussel, (UK, SC3).

The three day meeting was attended by 63 delegates from Australia, China, Germany, Hungary, Italy, Japan, Korea, Switzerland, Sweden, UK and USA and involves a considerable amount of of detailed work to bring useful standards to public use. Chris brings to his new responsibilities considerable experience and involvement with ASTM standards and Kazuhiro has long been associated with JISC projects in Japan.

These new appointments reinforce Kratos commitment to development of good International standards for the benefit of the surface analysis community throughout the world - and practical support of the process nationally and internationally.

There's a useful list of published standards available on another page.