The application of complex multilayer thin film materials in devices, such as computer hard disk media, is steadily increasing so that the production of these materials must increase without compromising quality. The technique of X-ray photoelectron spectroscopy (XPS) is ideally suited to provide critical information on film thickness and chemical composition, although the technique is little used in a quality control environment. The AMICUS X-ray photoelectron spectrometer with its compact size and eose of operation is designed with quality control applications in mind. Here, the chemical state characterization and film thickness monitoring of computer hard disk media are demonstrated using AMICUS.

Figure 1: Schematic diagram showing the multilayers of a magnetic hard disk.