Details of Nova components and performance

VACUUM SYSTEM
Sample entry chamber (SEC)
Sample elevator (3 platen storage positions)
Turbomolecular pump (250l/sec) (oil free option)
Cold cathode wide range pressure gauge
236mm ID gate valve
Sample analysis chamber (SAC)
Stainless steel with Mu metal screening
Ion pump with cryoshield
Auxiliary pumping by titanium sublimation pump
Cold cathode wide range pressure gauge

X-RAY SOURCE
High power Al monochromator
500mm Rowland circle
Single quartz toroidal backplane
Indexed moveable anode face
Full computer control with read-back and interlocks

ELECTRON ENERGY ANALYSER
180° hemispherical analyser
165mm mean radius
Spherical mirror analyser
Fixed analyser transmission (FAT) mode

PHOTOELECTRON DETECTOR
MCP stack and delay-line detector
Scanned and snapshot spectroscopy modes
2D imaging mode

CHARGE NEUTRALISATION
Coaxial low energy electron source
Fully automatic

SAMPLE PLATENS
Standard 110mm diameter plane surface
ARXPS platen for 0 - 85° sample rotation
Compucentric rotation platen
Continuous 360° rotation about the vertical axis
Compucentric rotation about a point off central axis of platen

AUTOMATION AND SAMPLE VIEWING
5 axis software control of sample stage (platen dependent)
Software control of platen exchange
Automated small area selection
Optical microscope in SEC (110mm field of view)
High resolution optical microscope in SAC (2mm field of view)

Kratos Analytical Ltd has a policy of continuous product improvement and therefore reserves the right to make alterations to specifications without notice.  Whilst Kratos Analytical Ltd believes this documentation to be true and accurate, Kratos Analytical cannot be held responsible for any errors and omissions contained herein.