SAMPLE HANDLING
The AXIS Nova sample handling and platen navigation system integrates in-situ optical microscopes with the Vision acquisition software for easy, rapid definition of sample analysis positions. Both full platen and 2mm high resolution optical images can be saved into a dataset and recalled for sample positioning. A large view port allows the user to see the platen in the analysis chamber giving complete confidence in sample location.

An orthogonal colour camera in the sample entry chamber (SEC) provides a digital image of the entire 110mm platen allowing XPS analysis positions to be defined with precision. For large homogeneous samples spectra can be acquired directly from the defined points using an automated sample height definition routine. Alternatively the chosen position can be translated to the high resolution orthogonal microscope in the analysis chamber. The in-situ optics ensure maximum flexibility, avoiding the need for separate external alignment systems so that samples may be re-examined during analysis for greatest analytical flexibility. The high magnification optical image can also be used to directly define the analysis position for selected area spectroscopy. Storage for three 110mm diameter platens is provided in the SEC giving a total of 285cm² accessible analysis area. Automated multi-platen exchange allows platen transfer from the SEC to the analysis position without user intervention.

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