DELAY-LINE DETECTOR
Kratos Analytical continues to lead in the development of imaging X-ray photoelectron spectrometers with the introduction of the delay-line detector (DLD). Representing the next generation of photoelectron detectors, the DLD provides a single pulse counting detector for both spectroscopy and imaging experiments. Comprising a multi-channel plate stack above two orthogonal delay-line anodes and associated electronic control units, the DLD is at the heart of the AXIS Nova. With a large active area the DLD possesses 128 channels for photoelectron detection in spectroscopy mode. The high number of channels means that, as well as collecting photoelectrons in usual energy scanning mode, the spectrometer can also be used to collect spectra with 128 data points without scanning the analyser, also known as ‘snapshot’ spectroscopy. This mode allows an individual photoelectron peak to be collected in less than 1 second with obvious advantages for data acquisition during depth profiling or dynamic surface characterisations.

When used in parallel imaging mode photoelectrons with 2D spatial distribution are incident on the DLD. The fast DLD control electronics convert the electron arrival position on each of the two delay-line anodes into an x, y co-ordinate for every electron event. Integrating the signals over several seconds allows the generation of truly quantitative elemental or chemical images of the surface over a 65,500 pixel array. In the highest magnification imaging mode the spatial resolution at the surface is <3µm. As further discussed in technical note MO223, a significant advantage of the digital DLD technology is that the system has inherent low noise characteristics with spike immunity assured.

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