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 Thank you for visiting the Kratos Surface Analysis site. For the last forty years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we are committed to continuing with development of leading technologies. As we move into our 5th decade Kratos Analytical is fully committed to service, quality and customer satisfaction, and we believe that this specialist web area will help you find the information you need for your surface analytical applications .
Kratos Analytical are now in their 40th year of manufacturing photoelectron spectrometers which started in 1969 with the ES-100 through to the current state-of-the-art AXIS Nova with delay-line detector. An overview of the Kratos XPS instruments can be found using the 'Instruments' menu on the left hand side of this page.
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Read more... [Welcome]
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European Users Meeting review |
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Written by Adam Roberts
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Thursday, 08 July 2010 13:14 |
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For those that know anything about Manchester it might prove difficult to believe but the sun shone for the three day duration of the European Kratos Users’ Meeting. With 34 different institutions from 11 different countries represented it was very well attended meeting. The standard of presentations was, as with previous meetings, very high and demonstrated the world-leading surface analysis performed using Kratos spectrometers.
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Last Updated on Monday, 26 July 2010 15:11 |
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Read more... [European Users Meeting review]
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Reconstructed Depth Profiles from ARXPS using MEM |
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Following the oral presentation of the paper 'Application and Optimization of Depth Profile Reconstruction from XPS Data Using the Maximum Entropy Method' at ECASIA 09 and AVS56 we are pleased to announce that an demo copy of the software is available.
If you are interested in receiving a copy of the software for reconstruction of depth profiles please send contact details using the 'Applications Support' link in the 'Contacts' menu on the left hand side. As the software will be distributed on a memory stick please include a postal address.
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Read more... [Reconstructed Depth Profiles from ARXPS using MEM]
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2010 Users Meetings |
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We have hosted the 5th Bi-Annual European Users Meeting in Manchester with 34 different institutions from 11 different countries represented. The meeting followed a similar format to previous meetings with contributions from both Users and Kratos staff.
Most of the presentations have been made available in the Memeber's Area of the website along with some photographs from the meeting and social events. Once logged in you can use this link to take you to the Users' Meetings section of the Downloads area.
Also of interest may be the US Users Meeting hosted in New York, USA on 13th – 15th September.
At this meeting we will be presenting the latest developments from Kratos Analytical including the polyatomic ion source and Vision Acquisition and Processing software. As well as encouraging Users’ contributions we would also welcome suggestions for topics to be addressed during the meeting.
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Last Updated on Monday, 28 June 2010 14:58 |
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Read more... [2010 Users Meetings]
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Copyright © 2010 Kratos Surface Analysis. All Rights Reserved.
Kratos Analytical Ltd is registered in England with company number 563161.
Registered Offices Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK
