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 Thank you for visiting the Kratos Surface Analysis site. For over forty years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we are committed to continuing with development of leading technologies. Now into our 5th decade Kratos Analytical is fully committed to service, quality and customer satisfaction, and we believe that this specialist web area will help you find the information you need for your surface analytical applications.
Kratos Analytical started manufacturing photoelectron spectrometers in 1969 with the ES-100 and continue to manufacture state-of-the-art, market leading instruments such as the AXIS Nova with delay-line detector. An overview of the Kratos XPS instruments can be found using the 'Instruments' menu on the left hand side of this page.
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Read more... [Welcome]
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Monday, 01 October 2012 09:21 |
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For those of you who didn't attend the recent European and US Users' Meetings, many of the presentations are now available in our Members' Downloads section, via this link.
Latest additions include four papers presented at the 2012 US users' meeting (file name "KAUST papers"), "XPS of Difficult Samples" (Mark Engelhard, EMSL), and Ar Gas Cluster Ion Source, a Kratos presentation covering GCIS theory, design, implementation and applications – van der Waals clusters and supersonic expansion.
Don't forget that you need to login to access these documents.
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Monday, 16 January 2012 10:12 |
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Kratos Analytical Ltd has recently lauched a Facebook page which can be accessed using this link. The aim of this is to allow Kratos Users and the wider surface analysis community to communicate with each other and Kratos through this easy to use social media site.
So, got a question or comment? Why not share it on our Facebook page?
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Read more... [Kratos' Facebook page]
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