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 Thank you for visiting the Kratos Surface Analysis site. For the last forty years Kratos Analytical has provided state-of-the-art spectrometers for surface analysis and we are committed to continuing with development of leading technologies. As we move into our 5th decade Kratos Analytical is fully committed to service, quality and customer satisfaction, and we believe that this specialist web area will help you find the information you need for your surface analytical applications .
Kratos Analytical are now in their 40th year of manufacturing photoelectron spectrometers which started in 1969 with the ES-100 through to the current state-of-the-art AXIS Nova with delay-line detector. An overview of the Kratos XPS instruments can be found using the 'Instruments' menu on the left hand side of this page.
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Read more... [Welcome]
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2010 Users Meetings |
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We are excited to announce the dates for the International Kratos Users' Meetings as follows:
21st – 23rd June European Users Meeting hosted in Manchester, UK.
13th – 15th September US Users Meeting hosted in New York, USA.
It is intended that the meetings will follow a similar format to those held in 2008, with contributions from Kratos staff and Users. We will be presenting the latest developments from Kratos Analytical including the polyatomic ion source and Vision Acquisition and Processing software. As well as encouraging Users’ contributions we would also welcome suggestions for topics to be addressed during the meeting.
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Last Updated on Wednesday, 27 January 2010 17:31 |
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Read more... [2010 Users Meetings]
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Reconstructed Depth Profiles from ARXPS using MEM |
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Following the oral presentation of the paper 'Application and Optimization of Depth Profile Reconstruction from XPS Data Using the Maximum Entropy Method' at ECASIA 09 and AVS56 we are pleased to announce that an demo copy of the software is available.
If you are interested in receiving a copy of the software for reconstruction of depth profiles please send contact details using the 'Applications Support' link in the 'Contacts' menu on the left hand side. As the software will be distributed on a memory stick please include a postal address.
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Read more... [Reconstructed Depth Profiles from ARXPS using MEM]
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Copyright © 2010 Kratos Surface Analysis. All Rights Reserved.
Kratos Analytical Ltd is registered in England with company number 563161.
Registered Offices Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK
